Publications

Found 3 results
Filters: Author is Thomas J. E. Schwarz  [Clear All Filters]
2004
Hong B, Schwarz TJE, Brandt S, Long DDE. Reliability of MEMS-Based Storage Enclosures. In: MASCOTS '04: Proceedings of the The IEEE Computer Society's 12th Annual International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunications Systems. MASCOTS '04: Proceedings of the The IEEE Computer Society's 12th Annual International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunications Systems. Washington, DC, USA: IEEE Computer Society; 2004. pp. 571–579.
2003
Xin Q, Miller EL, Schwarz TJE, Long DDE, Brandt S, Litwin W. Reliability Mechanisms for Very Large Storage Systems. In: MSS '03: Proceedings of the 20 th IEEE/11 th NASA Goddard Conference on Mass Storage Systems and Technologies (MSS'03). MSS '03: Proceedings of the 20 th IEEE/11 th NASA Goddard Conference on Mass Storage Systems and Technologies (MSS'03). Washington, DC, USA: IEEE Computer Society; 2003. p. 146.